首页>
外国专利>
SUPPLY VOLTAGE VARIATION ANALYSIS METHOD, SUPPLY CURRENT VARIATION ANALYSIS METHOD, SUPPLY VOLTAGE VARIATION ANALYSIS DEVICE AND SUPPLY CURRENT VARIATION ANALYSIS DEVICE
SUPPLY VOLTAGE VARIATION ANALYSIS METHOD, SUPPLY CURRENT VARIATION ANALYSIS METHOD, SUPPLY VOLTAGE VARIATION ANALYSIS DEVICE AND SUPPLY CURRENT VARIATION ANALYSIS DEVICE
PROBLEM TO BE SOLVED: To provide a supply voltage variation analysis method, a supply current variation analysis method, a supply voltage variation analysis device and a supply current variation analysis device that can quickly and precisely analyze even a large-scale semiconductor integrated circuit.;SOLUTION: The supply voltage variation analysis device comprises a circuit element selection part 1 for selecting one or more circuit elements constituting a semiconductor integrated circuit to be analyzed, an analytic pattern generation part 2 for generating an analytic pattern for operating all or part of the selected circuit elements, and an analysis part 3. The analysis part 3 comprises an analytic circuit extraction part 8 for extracting an analytic circuit constituted of the selected circuit elements and wiring-connected thereto, a supply voltage variation calculation part 9 for inputting the analytic pattern into the analytic circuit to calculate supply voltage variation values at a plurality of points in the analytic circuit, and an error detection part 10 for comparing the supply voltage variation values with preset thresholds.;COPYRIGHT: (C)2004,JPO
展开▼