首页> 外国专利> SPECTRUM ANALYSIS METHOD IN RUTHERFORD BACKSCATTERING SPECTROMETRY, AND RUTHERFORD BACKSCATTERING SPECTROSCOPIC ANALYZER

SPECTRUM ANALYSIS METHOD IN RUTHERFORD BACKSCATTERING SPECTROMETRY, AND RUTHERFORD BACKSCATTERING SPECTROSCOPIC ANALYZER

机译:拉特福德反散射光谱中的光谱分析方法及拉特福德反散射光谱分析仪

摘要

PROBLEM TO BE SOLVED: To conduct accurate and highly reliable analysis without specifying an erroneous composition ratio, as to a spectrum analyzing method in a Rutherford backscattering spectrometry.;SOLUTION: In this spectrum analysis method in the Rutherford backscattering spectrometry wherein an observed spectrum is acquired in a prescribed scattering angle, wherein an assumed distribution is set along a depth direction of an element concentration in a solid sample, wherein a theoretical spectrum based on the assumed distribution is found by simulation, and wherein the found theoretical spectrum is compared with the observed spectrum to analyze the element concentration in the solid sample, the observed spectra in two or more of the different scattering angles are acquired in the solid sample, and the acquired observed spectra in the plurality of scattering angles are compared at the same time.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:在不指定错误的组成比的情况下,进行准确而高度可靠的分析,涉及卢瑟福背向散射光谱法中的光谱分析方法;解决方案:在卢瑟福背向散射光谱法中使用这种光谱分析方法,其中可获取观察到的光谱在规定的散射角下,沿着固体样品中的元素浓度的深度方向设定推测分布,通过模拟求出基于该推测分布的理论光谱,并与观察到的理论光谱进行比较。光谱分析固体样品中的元素浓度,在固体样品中获取两个或多个不同散射角的观测光谱,并同时比较多个散射角中的观测光谱。 :(C)2004,日本特许厅

著录项

  • 公开/公告号JP2004191222A

    专利类型

  • 公开/公告日2004-07-08

    原文格式PDF

  • 申请/专利权人 KOBE STEEL LTD;

    申请/专利号JP20020360430

  • 申请日2002-12-12

  • 分类号G01N23/203;

  • 国家 JP

  • 入库时间 2022-08-21 23:27:22

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