首页> 外国专利> SEMICONDUCTOR STRUCTURE OF MEMORY DEVICE, COMPOSED OF SUBSTRATE OF FIRST CONDUCTIVITY TYPE, FIRST DOPANT REGION OF SECOND CONDUCTIVITY TYPE, SECOND DOPANT REGION, GATE DIELECTRIC, FIRST GATE CONDUCTOR, AND FIELD-EFFECT TRANSISTOR, AND PROGRAMMING METHOD FOR NON-VOLATILE MEMORY DEVICE

SEMICONDUCTOR STRUCTURE OF MEMORY DEVICE, COMPOSED OF SUBSTRATE OF FIRST CONDUCTIVITY TYPE, FIRST DOPANT REGION OF SECOND CONDUCTIVITY TYPE, SECOND DOPANT REGION, GATE DIELECTRIC, FIRST GATE CONDUCTOR, AND FIELD-EFFECT TRANSISTOR, AND PROGRAMMING METHOD FOR NON-VOLATILE MEMORY DEVICE

机译:存储器的半导体结构,由第一导电类型的基质,第二导电类型的第一掺杂区域,第二掺杂区域,栅极介电,第一栅极导体,电场效应晶体管和导电电阻组成

摘要

PURPOSE: A semiconductor structure of a memory device and a programming method for a non-volatile memory device are provided to improve high voltage endurance of a drain or a source of a transistor. CONSTITUTION: A semiconductor structure includes a substrate(102) of a first conductivity type, a first dopant region of a second conductivity type included in the substrate, a second dopant region, a gate dielectric(110B) formed on the second dopant region, a first gate conductor(112B) formed on the gate dielectric, and a field-effect transistor having a second gate conductor coupled to the first gate conductor. The second dopant region of the first conductivity type is formed in the first dopant region and is more heavily doped than the first dopant region. The second dopant region, the gate dielectric, and the gate conductor form one capacitor.
机译:目的:提供一种存储器件的半导体结构和一种用于非易失性存储器件的编程方法,以提高晶体管的漏极或源极的耐高压性。构成:一种半导体结构,包括第一导电类型的衬底(102),包含在该衬底中的第二导电类型的第一掺杂剂区域,第二掺杂剂区域,形成在第二掺杂剂区域上的栅极电介质(110B),第一栅极导体(112B)形成在栅极电介质上,并且场效应晶体管具有耦合到第一栅极导体的第二栅极导体。第一导电类型的第二掺杂剂区域形成在第一掺杂剂区域中,并且比第一掺杂剂区域更重地掺杂。第二掺杂剂区域,栅极电介质和栅极导体形成一个电容器。

著录项

  • 公开/公告号KR20040038864A

    专利类型

  • 公开/公告日2004-05-08

    原文格式PDF

  • 申请/专利权人 MICREL INC.;

    申请/专利号KR20030076625

  • 发明设计人 MOORE PAUL M.;

    申请日2003-10-31

  • 分类号H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 22:49:09

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