Integrated semiconductor circuit with a simple temperature detection circuit

摘要

A clock dividing circuit (1) outputs a divided clock. A delay circuit (85) is formed of at least one inverter to delay the divided clock to output a delayed divided clock. An EXOR circuit (4) receives the divided clock and the delayed divided clock. A pulse width measuring circuit (5) contains an integrating circuit which receives a signal output from a logic circuit and a Schmitt trigger circuit which receives a signal output from the integrating circuit. Since the trigger potential of the Schmitt trigger circuit is set to have a value that corresponds to a predetermined pulse width, the pulse width measurement circuit (5) outputs a signal that is confirmed with a pulse in response to a signal received by the logic circuit with a width of not less than a predetermined value. A latch circuit (6) stores a signal output of the pulse width measuring circuit (5).