ABNORMALITY PORTENT METHOD AND ABNORMALITY PORTENT SYSTEM

摘要

PPROBLEM TO BE SOLVED: To provide an abnormality portent method and a system, which can precisely predict serious abnormality having heavy influence on an object apparatus, based on the phenomenon emerging from the objective apparatus. PSOLUTION: In the abnormality portent method for predicting the serious abnormality occurring to the object apparatus, a plurality of phenomena occurring to the object apparatus are related to each other, on the basis of the relationship between the cause phenomenon and the secondary phenomenon caused by the cause phenomenon. At least one phenomenon occurring to the object apparatus is detected by various kinds of sensors. The plurality of phenomena related to the phenomenon are extracted to prepare an abnormality occurrence path reaching the serious abnormality. The occurrence probability and the time between two phenomena in the abnormality occurrence path are integrated, and the occurrence probability of the serious abnormality and the shortest time until the serious abnormality occurs are obtained. PCOPYRIGHT: (C)2005,JPO&NCIPI