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Methods of forming silicon-on-insulator comprising integrated circuitry, and wafer bonding methods of forming silicon-on-insulator comprising integrated circuitry

机译:形成包括集成电路的绝缘体上硅的方法,以及形成包括集成电路的绝缘体上硅的晶片键合方法

摘要

A wafer bonding method of forming silicon-on-insulator comprising integrated circuitry includes nitridizing at least a portion of an outer surface of silicon of a device wafer. After the nitridizing, the device wafer is joined with a handle wafer. A method of forming silicon-on-insulator comprising integrated circuitry includes nitridizing an interface of the silicon comprising layer of silicon-on-insulator circuitry with the insulator layer of the silicon-on-insulator circuitry. After the nitridizing, a field effect transistor gate is formed operably proximate the silicon comprising layer. Other methods, are disclosed. Integrated circuitry is contemplated regardless of the method of fabrication.
机译:形成包括集成电路的绝缘体上硅的晶片键合方法包括氮化器件晶片的硅的外表面的至少一部分。氮化之后,将器件晶片与操作晶片接合。一种形成包括集成电路的绝缘体上硅的方法,该方法包括氮化包含绝缘体上硅的电路层的硅与绝缘体上硅的电路的绝缘层的界面。在氮化之后,可操作地靠近含硅层形成场效应晶体管栅极。公开了其他方法。不论制造方法如何,都可以考虑使用集成电路。

著录项

  • 公开/公告号US6864155B2

    专利类型

  • 公开/公告日2005-03-08

    原文格式PDF

  • 申请/专利权人 ZHONGZE WANG;

    申请/专利号US20030340126

  • 发明设计人 ZHONGZE WANG;

    申请日2003-01-10

  • 分类号H01L21/30;

  • 国家 US

  • 入库时间 2022-08-21 22:19:16

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