首页> 外国专利> Integrated circuit formed by removing undesirable second oxide while minimally affecting a desirable first oxide

Integrated circuit formed by removing undesirable second oxide while minimally affecting a desirable first oxide

机译:通过去除不希望的第二氧化物同时最小地影响希望的第一氧化物而形成的集成电路

摘要

The present invention relates generally to removing an undesirable second oxide, while minimally affecting a desirable first oxide, on an integrated circuit. The integrated circuit may be part of a larger system.;The second oxide is first converted to another material, such as oxynitride. The other material has differing characteristics, such as etching properties, so that it can then be removed, without substantially diminishing the first oxide.;The conversion may be accomplished by heating. Heating may be accomplished by rapid thermal or furnace processing. Subsequently, the other material is removed from the integrated circuit, for example by hot phosphoric etching, so that the desirable first oxide is not substantially affected.
机译:本发明总体上涉及在集成电路上去除不期望的第二氧化物同时最小地影响期望的第一氧化物的方法。集成电路可能是较大系统的一部分。;首先将第二种氧化物转换为另一种材料,例如氮氧化物。另一种材料具有不同的特性,例如蚀刻特性,因此可以在基本上不减少第一氧化物的情况下将其去除。可以通过加热完成转化。加热可以通过快速热处理或炉子处理来完成。随后,例如通过热磷蚀刻从集成电路中去除另一种材料,从而基本上不影响期望的第一氧化物。

著录项

  • 公开/公告号US6891245B2

    专利类型

  • 公开/公告日2005-05-10

    原文格式PDF

  • 申请/专利权人 DAVID L. CHAPEK;JOHN T. MOORE;

    申请/专利号US20000563078

  • 发明设计人 DAVID L. CHAPEK;JOHN T. MOORE;

    申请日2000-04-24

  • 分类号H01L29/00;

  • 国家 US

  • 入库时间 2022-08-21 22:19:03

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