首页> 外国专利> METHOD FOR ENERGY RANKING OF MOLECULAR CRYSTALS USING DFT CALCULATIONS AND EMPIRICAL VAN DER WAALS POTENTIALS

METHOD FOR ENERGY RANKING OF MOLECULAR CRYSTALS USING DFT CALCULATIONS AND EMPIRICAL VAN DER WAALS POTENTIALS

机译:使用DFT计算和范德华电位的分子晶体能量分级方法

摘要

The invention refers to a method for the accurate determination of van der Waals parameters for high-precision determination of crystal structures and/or energies, comprising the steps of: numerically simulating at least one crystal structure based on density functional theory (DFT) calculations combined with a potential energy term representing van der Waals interactions; providing reference data containing accurate information about said at least one crystal structure; defining a deviation function (F) quantifying a deviation between said reference data and said at least one simulated crystal structure; fitting at least one parameter of said van der Waals potential term in such a way as to minimize said deviation function (F); and obtaining the accurate van der Waals parameters from the best fit. The invention furthermore deals with a hybrid method for the accurate van der Waals parameters from the best fit. The invention furthermore deals with a hybrid method for the accurate determination of crystal structures and/or energies based on such a parameter determination as well as the general application of such a hybrid method to the energy ranking of polymorphic crystal structures.
机译:本发明涉及一种用于高精度确定晶体结构和/或能量的范德华参数的精确确定方法,其包括以下步骤:基于密度泛函理论(DFT)计算的组合,对至少一个晶体结构进行数值模拟具有代表范德华相互作用的势能项;提供参考数据,该参考数据包含有关所述至少一种晶体结构的准确信息;定义偏差函数(F),以量化所述参考数据和所述至少一个模拟晶体结构之间的偏差;以使所述偏差函数(F)最小的方式拟合所述范德华势项的至少一个参数;并从最佳拟合中获得准确的范德华参数。此外,本发明涉及一种用于从最佳拟合中获得准确的范德华参数的混合方法。本发明还涉及一种基于这种参数确定来精确确定晶体结构和/或能量的混合方法,以及这种混合方法在多态晶体结构的能量分级中的一般应用。

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