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POLISHING CLOTH, WAFER POLISHING DEVICE, AND METHOD OF MANUFACTURING WAFER

机译:抛光布,硅片抛光装置以及硅片的制造方法

摘要

PPROBLEM TO BE SOLVED: To provide a polishing cloth that can supply a highly flat wafer by suppressing the occurrence of flaws and polishing marks, and to provide a wafer polishing device. PSOLUTION: The height of the surface of the outer periphery of the polishing cloth 12 used for polishing a wafer W is lowered by annularly grinding the outer periphery with a grinding plate 19 on which abrasive diamond grains are electrodeposited. Consequently, the highly flat wafer W which is reduced in plane dripping in the outer periphery can be manufactured, because the polishing resistance is reduced in the outer periphery of the polishing cloth 12. PCOPYRIGHT: (C)2006,JPO&NCIPI
机译:

要解决的问题:提供一种抛光布,其可以通过抑制缺陷和抛光痕迹的产生而提供高度平坦的晶片,并且提供一种晶片抛光装置。

解决方案:通过用在其上电沉积有金刚石磨粒的研磨板19环形研磨外周,来降低用于抛光晶片W的研磨布12的外周表面的高度。因此,因为在抛光布12的外周中减小了抛光阻力,所以可以制造在外周中减少了平面滴的高度平坦的晶片W。

版权所有:(C)2006,JPO&NCIPI

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