首页> 外国专利> Method for measuring a spectrum of a sample by means of an infrared spectrometer and infrared spectrometer of this type

Method for measuring a spectrum of a sample by means of an infrared spectrometer and infrared spectrometer of this type

机译:用这种红外光谱仪和这种红外光谱仪测量样品光谱的方法

摘要

A method for measuring a spectrum of a sample by means of an infrared spectrometer is described, the spectrometer comprising at least one component whose operating behavior is influenced by at least one operating parameter which, in the event of a change, changes the operating behavior of the at least one component and thereby influences the spectrum to be measured, the method comprising detecting the at least one operating parameter at least once during the measurement of the spectrum, reckoning back the operating behavior of the at least one component in a manner dependent on the detected operating parameter to a predetermined reference value of the operating parameter, and further conducting at least one of the following steps: measuring the spectrum on the basis of the predetermined reference value of the operating parameter, correcting the spectrum on the basis of the predetermined reference value of the operating parameter.
机译:描述了一种用于通过红外光谱仪测量样品的光谱的方法,该光谱仪包括至少一个组件,该组件的操作行为受到至少一个操作参数的影响,该至少一个操作参数在发生变化的情况下改变传感器的操作行为。所述至少一种组分并由此影响要测量的光谱,所述方法包括:在所述光谱的测量期间至少检测所述至少一个操作参数一次;以取决于以下方式的方式推算所述至少一种组分的操作行为:将检测到的运行参数恢复为运行参数的预定参考值,并进一步进行以下至少其中之一:基于运行参数的预定参考值测量频谱,根据预定的频谱进行校正操作参数的参考值。

著录项

  • 公开/公告号US2005259250A1

    专利类型

  • 公开/公告日2005-11-24

    原文格式PDF

  • 申请/专利权人 ARNO SIMON;

    申请/专利号US20050130435

  • 发明设计人 ARNO SIMON;

    申请日2005-05-16

  • 分类号B01D59/44;

  • 国家 US

  • 入库时间 2022-08-21 21:44:44

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号