TFT-LCD source driver with built-in test circuit and method for testing the same

摘要

A TFT-LCD source driver with a built-in test circuit includes N driving units and P test units. Each driving unit receives digital data and generates an analog output signal according to the digital data. Each test unit receives the analog output signals, selects one of them as a test signal according to a select signal, and compares the test signal with a high reference voltage and a low reference voltage to output an indication signal. The indication signal is set to indicate an abnormal state as the voltage of the test signal is higher than the high reference voltage or lower than the low reference voltage.