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Digital memory circuit for high bandwidth memory, has multiplexer connected to spare memory and serial output port of shift register, which substitutes fault bit value of serial data stream with spare bit
Digital memory circuit for high bandwidth memory, has multiplexer connected to spare memory and serial output port of shift register, which substitutes fault bit value of serial data stream with spare bit
A base memory which includes defective memory cell, is connected to shift register having serial output port and parallel ports. A spare memory stores spare bit corresponding to a defective memory cell. A multiplexer (19) connected to spare memory and serial output port of shift register (10), substitutes fault bit value of serial data stream with spare bit. The shift register converts parallel read data at parallel port to serial data stream which is output to serial output port. The data stream includes fault bit corresponding to defective memory cell. The multiplexer has primary and secondary input nodes connected to serial output port and to spare memory. The multiplexer selects serial data stream and spare bit at primary and secondary input nodes. An independent claim is also included for method for redundancy providing method in memory.
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