Analysis of at least partly reflecting surfaces involves varying relative orientation/position of object, pattern generation device and/or image receiver(s) for image reflected at surface, to obtain surface, especially geometry, information

摘要

The method involves varying the relative orientation and/or the relative position of the object (200), at least one pattern generation device/source in the visible and/or invisible region, especially at least one pattern generator (10) and/or at least one image receiver (20) for an image reflected at the surface (202), especially at least one optical sensor in order to obtain information about the surface, especially its geometry. An independent claim is also included for a device for analysis of at least partly reflecting surfaces.