首页> 外国专利> Microscope, has detector device and probe between which detection beam path extends, where detector device is arranged as introducible and collectively interchangeable detector module in detection beam path

Microscope, has detector device and probe between which detection beam path extends, where detector device is arranged as introducible and collectively interchangeable detector module in detection beam path

机译:显微镜具有检测器装置和在其间延伸检测光束路径的探针,其中该检测器装置被布置为在检测光束路径中可引入且可共同互换的检测器模块

摘要

The microscope has a light source and a probe between which an illumination beam path extends. A detection beam path (2) extends between the probe and a detector device. The detector device is arranged as an introducible and collectively interchangeable detector module (1) in the detection beam path. The detector module includes five independent detectors (3) which are exchangeable commonly or individually.
机译:显微镜具有光源和探头,照明光束路径在探头和光源之间延伸。检测光束路径(2)在探针和检测器装置之间延伸。该检测器装置被布置为在检测光束路径中可引入且可共同互换的检测器模块(1)。检测器模块包括五个独立的检测器(3),它们可以共同或单独更换。

著录项

  • 公开/公告号DE102005008619A1

    专利类型

  • 公开/公告日2006-09-07

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS CMS GMBH;

    申请/专利号DE20051008619

  • 发明设计人 SEIFERT ROLAND;

    申请日2005-02-23

  • 分类号G02B21/24;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:22

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