Test instrument setting method for field programmable gate array, involves configuring test instrument with output pins, and displaying list of output pins and input lines, to associate each pin with input line

摘要

The test instrument is configured with output pins based on configuration parameters including pin identification. A list of output pins and the input lines is displayed graphically, on a display screen, so as to associate each pin with the input line. Independent claims are also included for the following: (1) method of configuring logic analyzer; (2) test instrument; and (3) test system.