As Kelvin it is jointed to the lead/read of the electronic parts which are dealt with socket null inspection

摘要

PROBLEM TO BE SOLVED: To provide a probe capable of keeping mechanical strength of an insulator even when the thickness of the insulator arranged between conductors forming an electrode is reduced, which is a probe capable of Kelvin connection used for electric characteristic inspection of an electronic component.;SOLUTION: This electronic component inspection probe is characterized as follows: the probe comprises a pair of conductors connected together to one lead of an electronic component which is an inspection object and connected to a wiring part of a substrate connected to an inspection device, and an insulating structure for insulating the interval of the conductors; and the insulating structure comprises a metal body having an insulating layer at least on one surface in contact with the conductors.;COPYRIGHT: (C)2006,JPO&NCIPI