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Apparatus and method for sizing nanoparticles based on optical forces and interferometric field detection
Apparatus and method for sizing nanoparticles based on optical forces and interferometric field detection
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机译:基于光学力和干涉场检测的纳米颗粒定径装置和方法
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摘要
Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light are caused to interfere and detected by a split detector so that the effects of background light can be subtracted out, while the backscattered light is detected to detect the particles.
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