首页> 外国专利> Apparatus and method for sizing nanoparticles based on optical forces and interferometric field detection

Apparatus and method for sizing nanoparticles based on optical forces and interferometric field detection

机译:基于光学力和干涉场检测的纳米颗粒定径装置和方法

摘要

Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light are caused to interfere and detected by a split detector so that the effects of background light can be subtracted out, while the backscattered light is detected to detect the particles.
机译:来自激光源的光被分成参考臂和检测臂。检测臂中的光会聚到包含要检测的粒子的通道中,并被粒子反向散射。参考臂中的光被衰减。衰减和反向散射的光引起干涉,并由分离检测器进行检测,因此可以减去背景光的影响,同时检测反向散射的光以检测粒子。

著录项

  • 公开/公告号US2007030492A1

    专利类型

  • 公开/公告日2007-02-08

    原文格式PDF

  • 申请/专利权人 LUKAS NOVOTNY;FILIPP IGNATOVICH;

    申请/专利号US20060417254

  • 发明设计人 LUKAS NOVOTNY;FILIPP IGNATOVICH;

    申请日2006-05-04

  • 分类号G01B11/02;

  • 国家 US

  • 入库时间 2022-08-21 21:02:07

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