首页> 外国专利> LASER DIFFRACTION/SCATTERING TYPE PARTICLE SIZE DISTRIBUTION MEASURING INSTRUMENT

LASER DIFFRACTION/SCATTERING TYPE PARTICLE SIZE DISTRIBUTION MEASURING INSTRUMENT

机译:激光衍射/散射型颗粒尺寸分布测量仪器

摘要

PROBLEM TO BE SOLVED: To provide a laser diffraction/scattering type particle size distribution measuring instrument capable of obtaining an accurate measurement result of particle size distribution all the time, without condensing dew on a surface of a sample cell, even when a low temperature of medium liquid is used for the measurement.;SOLUTION: In this laser diffraction/scattering type particle size distribution measuring instrument, a spatial intensity distribution of diffracted/scattered light generated by irradiation of a laser beam is measured in a particle group which is to be measured and dispersed in the medium liquid in the sample cell 3 arranged inside a measuring space 12 surrounded by wall bodies 1a, 1b, and a particle distribution of the particle group to be measured is found based on a measured data. The particle size distribution measuring instrument is provided with gas introduction means 6, 7 for introducing a high purity of inert gas into the measuring space 12, and an exhaust means 9 for discharging a gas in the measuring space 12; the atmosphere in the measuring space 12 is thereby replaced with the purity of inert gas; the dew condensation on the surface of the sample cell 3 is thereby prevented being generated, even when using the low temperature of medium liquid; and multiple scattering or the like caused by the dew condensation is prevented from being generated to obtain the accurate measurement result of particle size distribution all the time.;COPYRIGHT: (C)2008,JPO&INPIT
机译:要解决的问题:提供一种激光衍射/散射式粒度分布测量仪器,即使在温度较低的情况下,也能够始终获得准确的粒度分布测量结果,而不会在样品池表面凝结露水。解决方案:在此激光衍射/散射式粒度分布测量仪中,测量由激光束照射产生的衍射/散射光的空间强度分布,该颗粒组将在在由壁体1a,1b围绕的测量空间12内布置的样品室3中的介质液体中进行测量和分散,并基于测量数据找到要测量的颗粒群的颗粒分布。粒度分布测量仪器包括:气体引入装置6、7,用于将高纯度的惰性气体引入到测量空间12中;排气装置9,用于将气体排放到测量空间12中;测量空间12中的气氛由此被惰性气体的纯度代替。由此,即使在使用低温的中型液体的情况下,也能够防止在样品池3的表面产生结露。并防止由于结露而产生的多次散射等,从而始终获得准确的粒度分布测量结果。;版权所有:(C)2008,日本特许经营&INPIT

著录项

  • 公开/公告号JP2008076298A

    专利类型

  • 公开/公告日2008-04-03

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号JP20060257567

  • 发明设计人 AKASAKA TAKESHI;MARUYAMA MITSURU;

    申请日2006-09-22

  • 分类号G01N15/02;G01N21/47;

  • 国家 JP

  • 入库时间 2022-08-21 20:22:43

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