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Composition comprising a 1,3-dicarbonyl compound chelating agent and a copper corrosion inhibitor for removing residues from a semiconductor substrate containing a copper structure
Composition comprising a 1,3-dicarbonyl compound chelating agent and a copper corrosion inhibitor for removing residues from a semiconductor substrate containing a copper structure
A semiconductor wafer cleaning formulation, including 2-98% wt. organic amine, 0-50% wt. water, 0.1-60% wt. 1,3-dicarbonyl compound chelating agent, 0-25% wt. of additional different chelating agent(s), 0.1-40% wt. nitrogen-containing carboxylic acid or an imine, and 2-98% wt polar organic solvent. The formulations are useful to remove residue from wafers following a resist plasma ashing step, such as inorganic residue from semiconductor wafers containing delicate copper interconnecting structures.
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