TEST HANDLER, LOT CARD ASSORTMENT METHOD OF LOT CARD ASSORTMENT APPARATUS FOR TEST HANDLER AND TEST SUPPORT METHOD OF TEST HANDLER

摘要

A test handler, a lot card assortment method of a lot card assortment apparatus for the test handler, and a test support method of the test handler are provided to assort lot cards according to the test support condition without special management and to support a test of semiconductor devices on the basis of lot information read from the lot cards. A test handler is composed of a lot card assortment apparatus(500) for receiving plural lot cards inputted from a manager and then assorting plural lot cards according to information about test support conditions of semiconductor devices and a controller(100) transmitting information about test support conditions of semiconductor devices to the lot card assortment apparatus. The lot card assortment apparatus comprises an input/output unit for inserting or discharging plural lot cards and a lot card assorting unit dividing plural lot cards according to each test support condition in receiving information about test support conditions from the controller.