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OPTIMIZING DESIGNING APPARATUS OF INTEGRATED CIRCUIT, OPTIMIZING DESIGNING METHOD OF INTEGRATED CIRCUIT, AND STORING MEDIUM IN WHICH PROGRAM FOR CARRYING OUT OPTIMIZING DESIGNING METHOD OF INTEGRATED CIRCUIT IS STORED
OPTIMIZING DESIGNING APPARATUS OF INTEGRATED CIRCUIT, OPTIMIZING DESIGNING METHOD OF INTEGRATED CIRCUIT, AND STORING MEDIUM IN WHICH PROGRAM FOR CARRYING OUT OPTIMIZING DESIGNING METHOD OF INTEGRATED CIRCUIT IS STORED
It is an object of the present invention to provide a method, an apparatus and a program having high optimization precision and capable of obtaining an answer required by a designer in a short time by combining optimization between individual transistors and optimization as the entire circuit, or by appropriately combining judgment of an operation region, an analysis of the operation region and a SWEEP sensitivity analysis when the optimization is carried out. An optimizing designing apparatus of an integrated circuit for designing a circuit, comprises operation region judging means for adjusting an operation region (linear region, saturation region) of the circuit, operation region analysis means for displaying liner characteristics (Ids-Vgs characteristics) of the circuit and saturation characteristics (Ids-Vds characteristics) of the circuit, and SWEEP sensitivity analysis means for displaying variation in output characteristics of the circuit.
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