首页> 外国专利> A method and arrangement for the thermal treatment of a single-crystal valley between lini lamina, single-crystal valley lini ches platelets and a process for the preparation of a single-crystal valley between platelet lini

A method and arrangement for the thermal treatment of a single-crystal valley between lini lamina, single-crystal valley lini ches platelets and a process for the preparation of a single-crystal valley between platelet lini

机译:一种用于治疗小扁豆薄板之间的单晶谷的方法和装置,用于制备小扁桃之间的单晶谷的方法以及用于制备小扁桃之间的单晶谷的方法

摘要

A method for heat-treating a single-crystal silicon wafer by which the number of single-crystal silicon wafers treated in a single heat-treating process is increased and, at the same time, dislocation and slip in a high-temperature heat-treating atmosphere are suppressed at the time of performing various kinds of heat treatment, such as a diffusion heat treatment for forming a DZ layer, a treatment for generating and controlling BMD for giving the IG ability, a heat treatment for improving the withstand voltage of an oxide film by eliminating COP defects on and in the wafers. The wafers are divided into groups of about 10 wafers, the wafers of each group are stacked, and a plurality of groups of wafers are placed horizontally or in a state that the wafers are inclined slightly by an angle of 0.5-5° on a boat which supports the wafers at a plurality of points on the outer peripheries of the wafers. Therefore, as shown in embodiments, various kinds of heat treatment can be applied to the wafers and the wafers are heat-treated uniformly, because dislocation and slip of the wafers are prevented.
机译:一种用于热处理单晶硅晶片的方法,通过该方法,增加了在一次热处理过程中处理的单晶硅晶片的数量,并且同时在高温热处理中使位错和打滑在进行各种热处理时,例如形成DZ层的扩散热处理,产生和控制赋予IG能力的BMD的处理,提高氧化物的耐压的热处理等,可以抑制气氛的发生。通过消除晶片上和晶片中的COP缺陷来成膜。将晶片分成大约10个晶片的组,将每组晶片堆叠,将多组晶片水平放置或以晶片在船上稍微倾斜0.5-5°的状态放置它在晶片的外围上的多个点处支撑晶片。因此,如实施方式所示,由于可以防止晶片的错位和打滑,因此可以对晶片进行各种热处理,并且可以对晶片进行均匀的热处理。

著录项

  • 公开/公告号DE69738020T2

    专利类型

  • 公开/公告日2008-07-31

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE1997638020T

  • 发明设计人

    申请日1997-06-27

  • 分类号H01L21/324;H01L21/322;

  • 国家 DE

  • 入库时间 2022-08-21 19:47:34

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