Testboard with ZIF connectors, method of assembling, integrated circuit test system and test method introduced by the same

摘要

This invention discloses a test board with detachably adjustable ZIF connectors. The test board comprises a test substrate, a plurality of ZIF connectors and a plurality of detachably adjustable fastening means for assembling and disassembling the ZIF connectors on the test substrate. The test substrate has a first surface, a second surface and a plurality of first through-holes perpendicular to the first surface. Pairs of first electrical pads are provided on the first surface adjacent to both sides of first through-holes. A plurality of second electrical pads are provided on the second surface of the test substrate for electrically connecting the first electrical pads. The ZIF connectors are arranged on the first surface of the substrate. Each ZIF connector has a plurality of parallel second through-holes arranged from the top to the bottom of the connector and pairs of electrical terminals are disposed on the bottom of each ZIF connector for contacting the first electrical pads of the test substrate. The detachably adjustable fastening means are disposed through the first and second through-holes to assembling and disassembling the ZIF connectors on the first surface of the substrate.