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Near single-crystalline, high-carrier-mobility silicon thin film on a polycrystalline/amorphous substrate

机译:多晶/非晶衬底上的近单晶,高载流子迁移率的硅薄膜

摘要

A template article including a base substrate including: (i) a base material selected from the group consisting of polycrystalline substrates and amorphous substrates, and (ii) at least one layer of a differing material upon the surface of the base material; and, a buffer material layer upon the base substrate, the buffer material layer characterized by: (a) low chemical reactivity with the base substrate, (b) stability at temperatures up to at least about 800° C. under low vacuum conditions, and (c) a lattice crystal structure adapted for subsequent deposition of a semiconductor material; is provided, together with a semiconductor article including a base substrate including: (i) a base material selected from the group consisting of polycrystalline substrates and amorphous substrates, and (ii) at least one layer of a differing material upon the surface of the base material; and, a buffer material layer upon the base substrate, the buffer material layer characterized by: (a) low chemical reactivity with the base substrate, (b) stability at temperatures up to at least about 800° C. under low vacuum conditions, and (c) a lattice crystal structure adapted for subsequent deposition of a semiconductor material, and, a top-layer of semiconductor material upon the buffer material layer.
机译:一种模板制品,包括基础基底,所述基础基底包括:(i)选自多晶基底和非晶基底的基底材料,和(ii)在基底表面上的至少一层不同的材料;在基础衬底上的缓冲材料层,该缓冲材料层的特征在于:(a)与基础衬底的化学反应性低,(b)在低真空条件下在至少约800℃的温度下的稳定性,和(c)适于随后沉积半导体材料的晶格晶体结构;提供与半导体制品一起的半导体制品,所述半导体制品包括基础基底,所述基础基底包括:(i)选自多晶基底和无定形基底的基底材料,和(ii)在基底表面上的至少一层不同的材料材料;在基础衬底上的缓冲材料层,该缓冲材料层的特征在于:(a)与基础衬底的化学反应性低,(b)在低真空条件下在至少约800℃的温度下的稳定性,以及(c)适于随后沉积半导体材料的晶格晶体结构,以及在缓冲材料层上的半导体材料的顶层。

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