REFRESH CHARACTERISTIC TEST CIRCUIT AND REFRESH CHARACTERISTIC TEST METHOD USING THE SAME

摘要

A refresh characteristic test circuit and a refresh characteristic test method using the same are provided to test a refresh fail by using reading data stored in a sub word line and leakage current due to an adjacent/passing gate effect. A selection signal generating unit(1) receives a first address and a test mode signal(TM) and generates a selection signal(MAT-MAT) for selecting a cell block. A main word line signal generating unit(2) receives a second address and the test mode signal and generates a main word line signal for selecting a main word line of the selected cell block. A sub word line signal generating unit(3) receives a third address and the test mode signal and generates a sub word line signal(SWL-SWL) for enabling a sub word line of the selected main word line.