首页> 外国专利> DYNAMIC LIGHT SCATTERING TYPE PARTICLE SIZE ANALYZER TO MINIMIZE A DISTORTION ERROR WHICH IS INEVITABLY ACCOMPANIED WITH HIGH-SPEED OPERATION

DYNAMIC LIGHT SCATTERING TYPE PARTICLE SIZE ANALYZER TO MINIMIZE A DISTORTION ERROR WHICH IS INEVITABLY ACCOMPANIED WITH HIGH-SPEED OPERATION

机译:动态光散射型颗粒尺寸分析仪,可以最大程度地减少伴随高速操作的失真误差

摘要

PURPOSE: A dynamic light scattering type particle size analyzer is provided to operate at high speed and high efficiency in order to measure the size distribution of nano particles which move fast.;CONSTITUTION: A dynamic light scattering type particle size analyzer includes a beam splitter, a first and a second multi pixel detector, a first and a second wave height selector, a correlator, and a granularity calculator. The beam splitter(10) branches off the scattered light which comes out when focusing a laser on a diffusion media including measurement particles into a first optical signal and a second optical signal. The first multi pixel detector(13a) converts the first optical signal to electric signal. The first wave height selector(14a) receives the electric signal from the first multi pixel detector, removes outputs the constant digital signal which removes the noises below the specific wave height, and outputs the noise-removed digital signal. The second multi pixel detector(13b) converts the second optical signal to electric signal. The second wave height selector(14b) receives the electric signal from the second multi pixel detector, removes outputs the constant digital signal which removes the noises below the specific wave height, and outputs the noise-removed digital signal. The correlator(15) receives the digital signals from the first and second wave height selectors through respective first and second channels, and produces a cross correlation function between the first and second channels. The granularity calculator computes the size of the particles based on the cross correlation function obtained by the correlator.;COPYRIGHT KIPO 2010
机译:目的:提供一种动态光散射型粒度分析仪,以高速,高效地运行,以便测量快速移动的纳米颗粒的粒度分布。;构成:一种动态光散射型粒度分析仪,包括分束器,第一和第二多像素检测器,第一和第二波高选择器,相关器和粒度计算器。分束器(10)将当将激光聚焦在包括测量颗粒的扩散介质上时发出的散射光分支为第一光信号和第二光信号。第一多像素检测器(13a)将第一光信号转换成电信号。第一波高选择器(14a)从第一多像素检测器接收电信号,去除输出恒定数字信号,该数字信号去除低于特定波高的噪声,并输出去除噪声的数字信号。第二多像素检测器(13b)将第二光信号转换为电信号。第二波高选择器(14b)从第二多像素检测器接收电信号,去除输出恒定数字信号,该数字信号去除低于特定波高的噪声,并输出去除噪声的数字信号。相关器(15)通过相应的第一和第二通道从第一和第二波高选择器接收数字信号,并在第一和第二通道之间产生互相关函数。粒度计算器根据相关器获得的互相关函数计算粒子的大小。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20090100581A

    专利类型

  • 公开/公告日2009-09-24

    原文格式PDF

  • 申请/专利权人 ZEUS CO. LTD.;

    申请/专利号KR20080025855

  • 发明设计人 YOON DEOK JOO;KIM YOUNG GUK;

    申请日2008-03-20

  • 分类号G01N15/02;

  • 国家 KR

  • 入库时间 2022-08-21 19:12:35

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号