首页> 外国专利> METHOD TO ELIMINATE DEFECTS IN SKIN GRAIN PATTER LAYER WITH NATURAL FRAIN PATTERN AND SKIN WITH ELIMINATED GRAIN PATTERN DEFECTS

METHOD TO ELIMINATE DEFECTS IN SKIN GRAIN PATTER LAYER WITH NATURAL FRAIN PATTERN AND SKIN WITH ELIMINATED GRAIN PATTERN DEFECTS

机译:消除自然纹样的皮肤颗粒层缺陷和消除谷物纹样的皮肤缺陷的方法

摘要

FIELD: process engineering.;SUBSTANCE: proposed method comprises eliminating defects representing damages sports (3) in layers (2) formed by recesses in skin (1) with natural grain patter. These defects are eliminated as follows, i.e. water or slightly foamed plastic suspension is forced into aforesaid recesses, the said suspension containing ultimate solid particles. Then skin (1) is dried, surface (4) of the layer of grain pattern (2) is subjected to pressure and thermal treatment with the help of pressure roller at least 100°C. Note here that plastic mass is formed in aforesaid recesses that contains hollow tiny balloons (5) made up of solid particles to completely fill the said recesses (dwg. 1).;EFFECT: higher quality.;13 cl, 1 dwg, 1 ex
机译:领域:提出的方法包括消除缺陷,这些缺陷代表由天然谷物花纹在皮肤(1)上的凹槽形成的层(2)中的运动层(3)的损伤。这些缺陷可以通过如下方法消除,即将水或稍微起泡沫的塑料悬浮液压入上述凹槽中,所述悬浮液包含最终的固体颗粒。然后将皮肤(1)干燥,将颗粒图案(2)的层的表面(4)在至少100℃的压力辊的帮助下进行加压和热处理。请注意,在上述凹槽中形成了塑料块,该凹槽中包含由实心颗粒组成的空心微小气球(5),以完全填充所述凹槽(dwg。1)。效果:更高的质量; 13 cl,1 dwg,1 ex

著录项

  • 公开/公告号RU2370544C2

    专利类型

  • 公开/公告日2009-10-20

    原文格式PDF

  • 申请/专利权人 BASF AKTSIENGEZELSHAFT;

    申请/专利号RU20060117192

  • 发明设计人 SHEFER FILIPP (DE);

    申请日2004-10-16

  • 分类号C14C11;C14C15;C14B7/02;

  • 国家 RU

  • 入库时间 2022-08-21 19:10:18

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