Method for digital measurement of pulse-type emission spectra, involves generating emission pulse of sample by unit and units for wavelength dependent local focusing of emitted light on semiconductor detector marked by pixel structure

摘要

The method involves generating an emission pulse of a sample by a unit, provided for the wavelength dependent local focusing of the emitted light on a semiconductor detector marked by pixel structure. The generation of the charge carrier quantity, which is measured, is started around a certain time interval after the generation of the emission pulse in delayed manner. The charge carrier quantity, generated for each pixel, is summed before the digitalization of a number of pulses.