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ANALYZING SYSTEM OF MATERIAL CHARACTERISTICS OF POLYCRYSTALLINE SOLID, ANALYZING METHOD OF MATERIAL CHARACTERISTICS OF POLYCRYSTALLINE SOLID, ANALYZING PROGRAM OF MATERIAL CHARACTERISTICS OF POLYCRYSTALLINE SOLID AND RECORDING MEDIUM
ANALYZING SYSTEM OF MATERIAL CHARACTERISTICS OF POLYCRYSTALLINE SOLID, ANALYZING METHOD OF MATERIAL CHARACTERISTICS OF POLYCRYSTALLINE SOLID, ANALYZING PROGRAM OF MATERIAL CHARACTERISTICS OF POLYCRYSTALLINE SOLID AND RECORDING MEDIUM
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机译:结晶固体的材料特性分析系统,结晶固体的材料特性分析方法,结晶固体的材料特性分析程序及记录介质
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摘要
PROBLEM TO BE SOLVED: To perform the three-dimensional numerical analysis of material characteristics minutely reflecting an actual material in detail without serious error, using the numerical data including the crystal orientation data and position data of a polycrystalline solid obtained from the measurement of EBSD of the polycrystalline solid.;SOLUTION: Numerical data Ai, which is obtained by measuring respective crystal grains being a measuring target using a back scattering electronic diffraction device with respect to crystal grains constituting the polycrystalline solid so as to contain a plurality of measuring points with respect to one crystal grain, is inputted to allot the inputted numerical data Ai to a finite element and a physical property value expressed by three-dimensional tensor is imparted to the finite element to construct a finite element model. This finite element model is used to perform the numerical analysis of the numerical data Ai.;COPYRIGHT: (C)2010,JPO&INPIT
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机译:解决的问题:使用包括从EBSD测量获得的多晶固体的晶体取向数据和位置数据在内的数值数据,对材料特性进行三维数值分析,以细微地反映出实际材料而不会造成严重误差。 SOLUTION:数值数据A i Sub>,该数据是通过使用反向散射电子衍射设备对构成多晶固体的晶粒测量作为测量目标的各个晶粒而获得的,从而包含相对于一个晶粒的多个测量点,输入以将输入的数值数据A i Sub>分配给有限元,并且将三维张量表示的物理特性值赋予有限元元素以构建有限元模型。该有限元模型用于对数值数据A i Sub>进行数值分析。版权所有:(C)2010,JPO&INPIT
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