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COUNTER EXAMPLE ANALYSIS SUPPORT DEVICE, COUNTER EXAMPLE ANALYSIS SUPPORT SYSTEM, COUNTER EXAMPLE ANALYSIS SUPPORT METHOD THEREFOR, AND PROGRAM

机译:反例分析支持设备,反例分析支持系统,反例分析支持方法和程序

摘要

PPROBLEM TO BE SOLVED: To solve the problem that it is difficult to identify a cause of a failure from one counter example in the verification of a system using a model inspection. PSOLUTION: A plurality of counter examples that are generated are accumulated, and the plurality of the accumulated counter examples are analyzed so that a process that appears in the most counter examples and processing that appears in the most counter examples are output. There is a high possibility that the process or the processing that appears in the most counter examples is the cause of a failure. PCOPYRIGHT: (C)2010,JPO&INPIT
机译:

要解决的问题:解决在使用模型检查进行系统验证时,难以从一个反例中确定故障原因的问题。

解决方案:累积所生成的多个反例,并且分析所累积的多个反例,从而输出出现在最反例中的处理和出现在最反例中的处理。大多数反例中出现的过程或处理很有可能是导致失败的原因。

版权:(C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP2010205066A

    专利类型

  • 公开/公告日2010-09-16

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP20090051093

  • 发明设计人 NODA NATSUKO;

    申请日2009-03-04

  • 分类号G06F11/36;G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 19:05:45

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