首页> 外国专利> EXPOSURE SYSTEM, METHOD FOR MANUFACTURING EXPOSURE SYSTEM, METHOD FOR CONTROLLING TEMPERATURE OF EXPOSURE SYSTEM, AND METHOD FOR MANUFACTURING DEVICE

EXPOSURE SYSTEM, METHOD FOR MANUFACTURING EXPOSURE SYSTEM, METHOD FOR CONTROLLING TEMPERATURE OF EXPOSURE SYSTEM, AND METHOD FOR MANUFACTURING DEVICE

机译:曝光系统,曝光系统的制造方法,曝光系统的温度控制方法及装置的制造方法

摘要

PROBLEM TO BE SOLVED: To provide an exposure system capable of suppressing temperature fluctuation due to thermal disturbance.;SOLUTION: An exposure system for forming a predetermined pattern on a substrate using exposure light includes: a substrate stage having a movable body capable of moving while supporting the substrate; an optical member emitting the exposure light to the substrate; a structural member for supporting at least one or both of the substrate stage and the optical member; and a channel provided inside the structural member, wherein temperature control fluid capable of controlling an inside of a space formed by the structural member to a predetermined temperature flows in the channel.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种能够抑制由于热干扰引起的温度波动的曝光系统。解决方案:利用曝光光在基板上形成预定图案的曝光系统包括:基板台,该基板台具有可移动的同时能够移动的主体。支撑基板;光学构件将曝光光发射到基板;用于支撑基板台和光学构件中的至少一个或两者的结构构件;设置在结构部件内部的通道,其中能够将由结构部件形成的空间的内部控制到预定温度的温度控制流体在该通道中流动。版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2010245525A

    专利类型

  • 公开/公告日2010-10-28

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20100072176

  • 发明设计人 MIZUTANI TAKAYUKI;

    申请日2010-03-26

  • 分类号H01L21/027;G03F7/20;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:37

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号