首页> 外国专利> ABNORMAL PIXEL DETERMINATION METHOD, DEFECTIVE PIXEL DETERMINATION METHOD BASED ON ABNORMAL PIXEL DETERMINATION, RADIOGRAPH DETECTOR, ABNORMAL PIXEL DETERMINATION SYSTEM AND DEFECTIVE PIXEL DETERMINATION SYSTEM

ABNORMAL PIXEL DETERMINATION METHOD, DEFECTIVE PIXEL DETERMINATION METHOD BASED ON ABNORMAL PIXEL DETERMINATION, RADIOGRAPH DETECTOR, ABNORMAL PIXEL DETERMINATION SYSTEM AND DEFECTIVE PIXEL DETERMINATION SYSTEM

机译:异常像素确定方法,基于异常像素确定的缺陷像素确定方法,射线照相检测器,异常像素确定系统和缺陷像素确定系统

摘要

PROBLEM TO BE SOLVED: To provide an abnormal pixel determination method capable of accurately determining whether or not the radiation detection element of a radiograph detector is an abnormal pixel or a defective pixel.;SOLUTION: In the abnormal pixel determination method in the radiograph detector 1 having the plurality of radiation detection elements (x, y) for outputting actual image data F(x, y) in radiography and outputting a dark read value D(x, y) in dark read, on the basis of the actual image data F(x, y) outputted in the radiography or the dark read value D(x, y) outputted in the dark read performed at least once before or after the radiography from one radiation detection element (x, y) and the actual image data F(x', y') or the dark read value D(x', y') outputted from the plurality of radiation detection elements made to correspond to the radiation detection element (x, y) beforehand, whether or not the one radiation detection element (x, y) is the abnormal pixel is determined.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种能够准确地确定放射线照片检测器的放射线检测元件是异常像素还是缺陷像素的异常像素确定方法。解决方案:在放射线照片检测器1中的异常像素确定方法中。具有多个放射线检测元件(x,y),基于实际图像数据F,放射线检测元件(x,y)在放射线摄影中输出实际图像数据F(x,y),并且在黑暗读取时输出暗读取值D(x,y)。在放射线照相中输出的(x,y)或在暗读取中输出的暗读取值D(x,y)在放射线照相之前或之后从一个放射线检测元件(x,y)和实际图像数据F至少执行一次。 (x',y')或从预先对应于放射线检测元件(x,y)的多个放射线检测元件输出的暗读取值D(x',y'),无论是否进行一次放射线检测元素(x,y)是确定的异常像素ned。; COPYRIGHT:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010074644A

    专利类型

  • 公开/公告日2010-04-02

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA MEDICAL & GRAPHIC INC;

    申请/专利号JP20080241246

  • 发明设计人 YONEKAWA HISASHI;

    申请日2008-09-19

  • 分类号H04N5/32;A61B6;H04N5/335;

  • 国家 JP

  • 入库时间 2022-08-21 19:02:18

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号