首页> 外国专利> SAMPLE AND HOLD INTEGRATED CIRCUIT, METHOD FOR COMPENSATION LEAKAGE IN SAMPLE AND HOLD CIRCUIT, AND SAMPLING CIRCUIT USED IN INTEGRATED CIRCUIT

SAMPLE AND HOLD INTEGRATED CIRCUIT, METHOD FOR COMPENSATION LEAKAGE IN SAMPLE AND HOLD CIRCUIT, AND SAMPLING CIRCUIT USED IN INTEGRATED CIRCUIT

机译:样品和保持集成电路,样品和保持电路中的补偿泄漏的方法以及在集成电路中使用的采样电路

摘要

PROBLEM TO BE SOLVED: To provide a method and an apparatus for holding a sampled value for a long time on a capacitor and substantially reducing the effects of switch leakage current with respect to the stored value.;SOLUTION: A sample and hold circuit in one aspect includes first and second switches. The first switch can be coupled to receive an input signal and to sample the input signal using a first capacitor. A first leakage current flows between first and second conductive terminals of the first switch and accumulates as a first leakage charge in the first capacitor. A second leakage current flows between the first and second conductive terminals of the second switch and accumulates as a second leakage charge in the second capacitor. An offset circuit produces a compensated sampled value by subtracting a quantity from a signal developed in response to the held sampled signal and charge accumulated through the first switch, wherein the quantity is developed in response to the accumulated leakage charge in the second capacitor.;COPYRIGHT: (C)2010,JPO&INPIT
机译:要解决的问题:提供一种方法和装置,用于将采样值长时间保持在电容器上,并相对于存储值大幅降低开关泄漏电流的影响。方面包括第一和第二开关。第一开关可被耦合以接收输入信号并使用第一电容器对输入信号进行采样。第一泄漏电流在第一开关的第一和第二导电端子之间流动,并作为第一泄漏电荷累积在第一电容器中。第二泄漏电流在第二开关的第一导电端子和第二导电端子之间流动,并且作为第二泄漏电荷累积在第二电容器中。偏移电路通过从响应于所保持的采样信号的信号和通过第一开关积累的电荷中产生的信号中减去一个量来产生补偿的采样值,其中该量响应于第二电容器中的累积泄漏电荷而产生。 :(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010074833A

    专利类型

  • 公开/公告日2010-04-02

    原文格式PDF

  • 申请/专利权人 POWER INTEGRATIONS INC;

    申请/专利号JP20090215815

  • 发明设计人 WANG ZHAO-JUN;

    申请日2009-09-17

  • 分类号H03K17/00;H03K17/687;H03K17/60;G01R19/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:02:18

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