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METHOD FOR TESTING A VARIABLE DIGITAL DELAY LINE AND A DEVICE HAVING VARIABLE DIGITAL DELAY LINE TESTING CAPABILITIES
METHOD FOR TESTING A VARIABLE DIGITAL DELAY LINE AND A DEVICE HAVING VARIABLE DIGITAL DELAY LINE TESTING CAPABILITIES
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机译:可变数字延迟线的测试方法及具有可变数字延迟线测试能力的装置
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摘要
A device and a method for testing a variable digital delay line that includes multiple taps. The method includes providing, an input signal to the variable digital delay line and finding, for each tap out of a group of tested taps of the variable digital delay line, a variable delay unit configuration that provides a delay that is closest to a delay introduced by the tap; wherein the variable digital delay line and the variable delay unit belong to the same integrated circuit.
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