FAULTY SITE IDENTIFICATION APPARATUS, FAULTY SITE IDENTIFICATION METHOD, AND INTEGRATED CIRCUIT

摘要

A faulty site identification apparatus for identifying a faulty site in an integrated circuit, the faulty site identification apparatus including a scan chain constituted by coupling a plurality of sequential circuit elements and adapted to output a scan data by shifting out setting data that is set to each of the plurality of sequential circuits, a setting section that sets the setting data to at least one sequential circuit element of the plurality of sequential circuit elements and an identification section that identifies a faulty site in the scan chain on the basis of the scan data from the scan chain to which the setting data is set to the at least one sequential circuit element by the setting section.