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Method for blocking unknown values in output response of scan test patterns for testing circuits
Method for blocking unknown values in output response of scan test patterns for testing circuits
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机译:用于阻塞用于测试电路的扫描测试图案的输出响应中的未知值的方法
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摘要
A method includes compressing control patterns describing values required at the control signals of blocking logic gates, by linear feedback shift register LFSR reseeding; bypassing blocking logic gates for some groups of scan chains that do not capture unknown values in output response of scan test patterns for testing circuits; and reducing numbers of specified bits in densely specified ones of the control patterns for further reducing the size of a seed of the LFSR.
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