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Semiconductor nanoparticle fluorescent reagent and fluorescence determination method
Semiconductor nanoparticle fluorescent reagent and fluorescence determination method
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机译:半导体纳米粒子荧光剂及荧光测定方法
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摘要
The present invention measures defect fluorescence exhibited from a defect level mainly on a semiconductor nanoparticle surface site which has an energy level existing inside the forbidden band of energy levels inside the semiconductor nanoparticle.
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