首页> 外国专利> METHOD FOR MANUFACTURING AN LDMOS TRANSISTOR CAPABLE OF PREVENTING AN LDMOS CHANNEL REGION FROM BEING INFLUENCED BY THE DENSITY OF IMPURITIES

METHOD FOR MANUFACTURING AN LDMOS TRANSISTOR CAPABLE OF PREVENTING AN LDMOS CHANNEL REGION FROM BEING INFLUENCED BY THE DENSITY OF IMPURITIES

机译:制造可防止杂质密度影响LDMOS沟道区域的LDMOS晶体管的方法

摘要

PURPOSE: A method for manufacturing an LDMOS transistor is provided to obtain a stably threshold voltage by preventing the asymmetry of a threshold voltage due to a gradient of a photo resist. ;CONSTITUTION: A photo resist pattern is formed on a semiconductor substrate. An incline etch section(130,132) is formed on the lower side of the photo resist pattern by etching the open semiconductor substrate between the photo resist patterns. A channel(140) is formed by implanting impurity in the semiconductor substrate using the photo resist pattern. A body region(150) is formed by vertically implanting impurities in the lower side of the semiconductor substrate with a channel.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于制造LDMOS晶体管的方法,以通过防止由于光致抗蚀剂的梯度引起的阈值电压的不对称来获得稳定的阈值电压。 ;组成:在半导体衬底上形成光刻胶图形。通过在光致抗蚀剂图案之间蚀刻开口的半导体衬底,在光致抗蚀剂图案的下侧上形成倾斜蚀刻部分(130,132)。通过使用光致抗蚀剂图案在半导体衬底中注入杂质来形成沟道(140)。通过在沟道的半导体衬底的下侧垂直注入杂质来形成主体区域(150)。COPYRIGHTKIPO 2011

著录项

  • 公开/公告号KR20110079014A

    专利类型

  • 公开/公告日2011-07-07

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20090135964

  • 发明设计人 KANG CHAN HEE;

    申请日2009-12-31

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:32

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号