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STRUCTURE OF LIGHT-EMITTING DEVICE USING THE AVALANCHE METAL-INSULATOR TRANSITION PHENOMENON IN SEMICONDUCTORS

机译:利用半导体中雪崩金属绝缘子过渡现象的发光器件结构

摘要

PURPOSE: the structure of luminescent device, to improve yield rate, is passed through reduction number of plies thin film light emitting device and simplifies manufacturing process using the semiconductor of Avalanche Metal insulator transition phenomenon. ;CONSTITUTION: semiconductor layer, wherein light emitting generation are included in snowslide domain. A buffer layer is formed on substrate. P-type or a n type semiconductor layer are formed on the buffer layer. First electrode layer is formed in the semiconductor layer, on the semiconductor layer. The second electrode lay is formed on the semiconductor layer. ;The 2011 of copyright KIPO submissions
机译:目的:通过减少层状薄膜发光器件的数量来提高发光器件的结构,以提高良率,并利用雪崩金属绝缘体过渡现象简化了半导体的制造工艺。 ;组成:半导体层,其中发光产生包括在雪崩域中。在基板上形成缓冲层。在缓冲层上形成P型或n型半导体层。在半导体层上的半导体层中形成第一电极层。第二电极层形成在半导体层上。 ; 2011年版权KIPO提交文件

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