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METHOD FOR DIAGNOSIS OF FUNCTIONAL FAULTS IN A FUNCTIONAL ARCHITECTURE

机译:功能体系结构中的功能故障诊断方法

摘要

The present invention data to be created and used for electronic devices (A ni; C ni; UCE n; B) to the connected functional unit and having a functional architecture in the functional failure diagnosis which method a related such, the data of at least one of the data (x i) is the unit of the electronic elements (a ni; C ni; UCE n; B) of the at least one operating fault occurs in subsequent to be a predetermined fixed value (x ip) the It may be employed. The method includes the feature as a function of the list determined during the determining step while the more specific values ​​in the list, diagnostic steps corresponding to a functional failure to include a diagnostic step and determining a particular value step, and decision step MSB sensors and actuators and that made for functional diagnostics features.
机译:将创建并用于电子设备的本发明数据(A n i; C n i; UCE n; B)连接到所连接的功能单元并具有功能故障诊断中的功能体系结构,该方法与数据(x i)中至少一个的数据相关。 Sub>是电子元素的单位(a n i; C n i; UCE n; B)中的至少一个随后发生的操作故障是预定的固定值(x ip)。该方法包括在确定步骤中确定的列表的功能,而列表中更具体的值,与功能故障相对应的诊断步骤包括诊断步骤和确定特定值的步骤以及决策步骤MSB传感器和执行器以及用于功能诊断功能的传感器和执行器。

著录项

  • 公开/公告号KR101027457B1

    专利类型

  • 公开/公告日2011-04-06

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20057011671

  • 发明设计人 부땡 사무엘;

    申请日2003-12-19

  • 分类号G05B23/02;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:21

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