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SEMICONDUCTOR CHIP FOR EVALUATION, EVALUATION SYSTEM, AND EVALUATION METHOD FOR HEAT RADIATING MATERIAL

机译:用于热辐射材料评估的半导体芯片,评估系统和评估方法

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor chip for evaluation by which heat resistance of a semiconductor device may be easily evaluated.;SOLUTION: A semiconductor chip for evaluation comprises a silicon substrate 100 working as a substrate of the semiconductor chip, on which a plurality of metal wiring films 101 for forming a resistance temperature sensing element consisting of a plurality of regions, one or a plurality of metal wiring films 102 for forming a heater consisting of one or a plurality of regions, an electrode 103 electrically connected to the metal wiring film 101, and another electrode 103 electrically connected to the metal wiring film 102 are formed.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种用于评估的半导体芯片,通过该半导体芯片可以容易地评估半导体器件的耐热性。解决方案:评估的半导体芯片包括用作半导体芯片的衬底的硅衬底100,硅衬底100用作半导体芯片的衬底。用于形成由多个区域构成的电阻温度感测元件的多个金属布线膜101,用于形成由一个或多个区域构成的加热器的一个或多个金属布线膜102,与金属电连接的电极103形成布线膜101,并形成另一个与金属布线膜102电连接的电极103。版权所有:(C)2012,JPO&INPIT

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