SEMICONDUCTOR CIRCUIT, SEMICONDUCTOR DEVICE, FAULT DIAGNOSIS METHOD FOR WIRING, AND FAULT DIAGNOSTIC PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor circuit, a semiconductor device, a fault diagnosis method for wiring, and a fault diagnostic program, capable of properly diagnosing disconnection and a short circuit of the wiring related to a battery.SOLUTION: A switch SW5 of a voltage apply part 24 is turned on to supply a voltage VCC to a wiring 27, and an output voltage Vout of a cell C4 is measured. If the output voltage Vout=0 V, it is determined that a short circuit has occurred between wirings V4 and V3. If the output voltage Vout0 V, it is determined that the wiring V4 is disconnected. A switch SW6 of a voltage apply part 26 is turned on to supply a voltage VREF to the wiring 27, and the output voltage Vout of a cell C1 is measured. If the output voltage Vout=0 V, it is determined that a short circuit has occurred between wirings V1 and V0. If the output voltage Vout0 V, it is determined that the wiring V1 is disconnected.