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Inspection standard setting device, inspection standard setting method and process inspection device

机译:检验标准设定装置,检验标准设定方法及工序检验装置

摘要

An information processing device stores an extracted feature of each inspection item of the process inspection, and a determination result of a final inspection in a memory device, calculates a separation degree between a distribution of features of products which were determined as good products at the final inspection and a distribution of features of products which were determined as defective products at the final inspection for every inspection item or every combination of inspection items based on data of the products stored in the memory device, selects an inspection item whose inspection standard is to be reset from the inspection items or the combinations of the inspection items based on a value of the separation degree. Thus providing a method of appropriately setting an inspection standard for detecting a defect sign during process inspection. Further a process inspection device and inspection standard setting device which implements the same.
机译:信息处理装置将工序检查的各检查项目的提取特征进行存储,并将最终检查的判定结果存储在存储装置中,计算最终确定为良品的产品的特征分布之间的分离度。根据存储在存储设备中的产品数据,针对每个检查项目或每个检查项目的组合,在最终检查时确定为次品的产品的检查和产品特性分布,选择要作为检查标准的检查项目根据分离度的值从检查项目或检查项目的组合中重置。从而提供一种适当地设置用于在过程检查期间检测缺陷标记的检查标准的方法。此外,过程检查装置和实施该检查装置的检查标准设定装置。

著录项

  • 公开/公告号US8224605B2

    专利类型

  • 公开/公告日2012-07-17

    原文格式PDF

  • 申请/专利权人 HIROSHI TASAKI;KAZUTO KOJITANI;

    申请/专利号US20060433702

  • 发明设计人 HIROSHI TASAKI;KAZUTO KOJITANI;

    申请日2006-05-12

  • 分类号G01N37;G06F19;

  • 国家 US

  • 入库时间 2022-08-21 17:30:03

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