首页> 外国专利> A METHOD FOR CORRECTION OF INEFFICIENCIES OF A SINGLE PHOTON COUNTING DETECTOR SYSTEM AT HIGH PHOTON RATES AND SINGLE PHOTON COUNTING DETECTOR SYSTEM

A METHOD FOR CORRECTION OF INEFFICIENCIES OF A SINGLE PHOTON COUNTING DETECTOR SYSTEM AT HIGH PHOTON RATES AND SINGLE PHOTON COUNTING DETECTOR SYSTEM

机译:单光子计数检测器系统的高光子率和单光子计数检测器效率的校正方法

摘要

It is an objective of the present invention to provide a method for correction of high rate inefficiencies of a single photon counting detector system and single photon counting detector system having this property in order be more precise in terms of photon counting. This objective is achieved according to the present invention by a method and a single photon counting pixel detector (chip or multi chip), comprising: a) a layer of photosensitive material; b) an N x M array of photo-detector diodes arranged in said layer of photosensitive material; each of said photo-detector diodes having a diode output interface; c) a N x M array of readout unit cells, one readout unit cell for each photo-detector diode; d) said readout unit cell comprising an input interface connected to said diode output interface, a high-gain charge to voltage amplifying means and a pixel counter being connected to an output of the high-gain voltage amplifying means, e) a calculation means for integrating the total number of incident photons over a predetermined total exposure time, wherein the total exposure time is split into sub-exposure intervals, wherein distinct rate corrections are applied to the sub-counts of the sub-exposure intervals and then the number of incident photons is calculated by summing the sub-counts which are individually corrected.
机译:本发明的目的是提供一种用于校正单光子计数检测器系统和具有该特性的单光子计数检测器系统的高效率低效率的方法,以便在光子计数方面更加精确。根据本发明,该目的通过一种方法和单光子计数像素检测器(芯片或多芯片)来实现,包括:a)一层光敏材料; b)布置在所述光敏材料层中的N×M个光电探测器二极管阵列;每个所述光电检测二极管具有二极管输出接口; c)N×M个读出单位单元阵列,每个光电检测二极管一个读出单位单元; d)所述读出单位单元,其包括连接到所述二极管输出接口的输入接口,到电压放大装置的高增益电荷和连接到高增益电压放大装置的输出的像素计数器,e)用于计算的计算装置。在预定的总曝光时间上对入射光子的总数进行积分,其中将总曝光时间划分为子曝光间隔,其中将不同的速率校正应用于子曝光间隔的子计数,然后应用入射数通过将单独校正的子计数相加来计算光子。

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