首页> 外国专利> COMPOUND USEABLE AS RESIST PROTECTIVE FILM COMPOSITION FOR REDUCING GENERATION OF DEFECTS IN IMMERSION OR DRY-EXPOSURE PROCESS, POLYMER COMPRISING THE SAME, AND RESIST PROTECTIVE FILM COMPOSITION

COMPOUND USEABLE AS RESIST PROTECTIVE FILM COMPOSITION FOR REDUCING GENERATION OF DEFECTS IN IMMERSION OR DRY-EXPOSURE PROCESS, POLYMER COMPRISING THE SAME, AND RESIST PROTECTIVE FILM COMPOSITION

机译:可用作抵抗保护膜成分的化合物,可减少浸渍或干燥过程中缺陷的产生,包含相同成分的聚合物和抵抗保护膜成分

摘要

PURPOSE: A compound is provided to have sufficient optical permeability, to make intermixing with a resist membrane difficult, to have proper hydrophilic or hydrophobic properties, to prevent pattern layout degradation, and to easily dissolve into an alkali developer.;CONSTITUTION: A compound is in chemical formula 1. In the chemical formula 1, R11 is one compound selected from the group consisting of hydrogen, halogen, C1-8 alkyl group and C1-5 halogenated alkyl group, R1 is one compound selected from the group consisting of an alkyl group, heteroalkyl group, aryl group, heteroaryl group, cycloalkyl group, heterocycloalkyl group alkylether group and akylcarbonyl group, R2 is one compound selected from the group consisting of hydrogen and a C1-5 alkyl group, and Q1 or Q2 is one compound selected from the group consisting of hydrogen and halogen, respectively and independently.;COPYRIGHT KIPO 2012
机译:用途:提供的化合物具有足够的透光性,难以与抗蚀剂膜混合,具有适当的亲水性或疏水性,防止图案布局退化,并易于溶解在碱性显影液中。在化学式1中,R 11是选自氢,卤素,C 1-8烷基和C 1-5卤代烷基中的一种化合物,R 1是选自烷基中的一种化合物。 R 2为选自氢和C 1-5烷基的化合物,并且Q 1或Q 2为选自以下的化合物:基团,杂烷基,芳基,杂芳基,环烷基,杂环烷基烷基醚基和烷基羰基。分别由氢和卤素组成的组。; COPYRIGHT KIPO 2012

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