首页> 外国专利> METHOD FOR MANUFACTURING A QUANTUM DOT USING A DIELECTRIC THIN FILM AND A THERMAL PROCESS AND A SEMICONDUCTOR STRUCTURE INCLUDING THE QUANTUM DOT

METHOD FOR MANUFACTURING A QUANTUM DOT USING A DIELECTRIC THIN FILM AND A THERMAL PROCESS AND A SEMICONDUCTOR STRUCTURE INCLUDING THE QUANTUM DOT

机译:用介电薄膜和热过程制造量子点的方法以及包括量子点的半导体结构

摘要

PURPOSE: A method for manufacturing a quantum dot and a semiconductor structure including the quantum dot are provided to selectively grow the quantum dot according to the function of a device by controlling the size, density, and growth location of a dielectric thin film pattern.;CONSTITUTION: A compound semiconductor layer including a quantum well structure with a first barrier layer, a well layer, and a second barrier layer is prepared. The compound semiconductor layer is a III-V group compound semiconductor or II-V group compound semiconductor. A dielectric thin film pattern including a first dielectric thin film and a second dielectric thin film is formed on the second barrier layer. The first dielectric thin film includes a width of a nanometer. The compound semiconductor layer with the dielectric thin film pattern is thermally processed.;COPYRIGHT KIPO 2013
机译:用途:提供一种制造量子点的方法和包括该量子点的半导体结构,以通过控制介电薄膜图案的尺寸,密度和生长位置,根据装置的功能选择性地生长量子点。组成:制备包括具有第一势垒层,阱层和第二势垒层的量子阱结构的化合物半导体层。化合物半导体层是III-V族化合物半导体或II-V族化合物半导体。在第二阻挡层上形成包括第一电介质薄膜和第二电介质薄膜的电介质薄膜图案。第一介电薄膜包括纳米的宽度。具有电介质薄膜图案的化合物半导体层经过热处理。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20120120834A

    专利类型

  • 公开/公告日2012-11-02

    原文格式PDF

  • 申请/专利权人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY;

    申请/专利号KR20110038620

  • 发明设计人 LEE HONG SEOK;

    申请日2011-04-25

  • 分类号H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-21 17:08:51

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