首页> 外国专利> SPECTRUM ANALYZER, MICROPARTICLE MEASURING DEVICE, AND METHOD AND PROGRAM FOR ANALYZING SPECTRA OR DISPLAYING SPECTRAL CHARTS

SPECTRUM ANALYZER, MICROPARTICLE MEASURING DEVICE, AND METHOD AND PROGRAM FOR ANALYZING SPECTRA OR DISPLAYING SPECTRAL CHARTS

机译:光谱分析仪,微粒测量装置以及光谱或显示光谱图的分析方法和程序

摘要

PROBLEM TO BE SOLVED: To provide a technique for obtaining a spectral chart capable of displaying a wide dynamic range and negative numbers and properly reflecting intensity of light generated from microparticles.SOLUTION: A spectrum analyzer is provided with a processor which generates analysis data from measured data, including intensity values of light from a measuring object detected and acquired by a plurality of photosensors having different detection wavelength ranges, using an analytical function that includes linear and logarithmic functions as function elements and uses the light intensity value as a variable. The spectrum analyzer presents the analysis data in the form of a spectral chart with one axis representing a value corresponding to the detection wavelength region and the other axis representing the output value of the analytical function, thereby displaying a wide dynamic range including negative values and suppressing dispersion to display a spectrum that properly represents optical properties of the measuring object.
机译:解决的问题:提供一种获取能够显示宽动态范围和负数并适当反映微粒产生的光强度的光谱图的技术。解决方案:光谱分析仪配有处理器,该处理器可以根据测量结果生成分析数据使用包括线性和对数函数作为函数元素的分析函数,并使用光强度值作为变量,包括来自由具有不同检测波长范围的多个光电传感器检测和获取的来自测量对象的光的强度值的数据。光谱分析仪以光谱图的形式呈现分析数据,其中一个轴代表与检测波长区域相对应的值,而另一个轴代表分析函数的输出值,从而显示出包括负值在内的宽动态范围,并抑制了色散以显示正确表示测量对象光学特性的光谱。

著录项

  • 公开/公告号JP2013061246A

    专利类型

  • 公开/公告日2013-04-04

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP20110199901

  • 发明设计人 NITTA TAKASHI;

    申请日2011-09-13

  • 分类号G01N21/64;G01N21/27;G01N15/14;

  • 国家 JP

  • 入库时间 2022-08-21 16:57:46

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