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INTEGRATED CIRCUIT, DISPLAY PANEL COMPRISING INTEGRATED CIRCUIT, AND CONNECTION RESISTANCE MEASUREMENT METHOD FOR INTEGRATED CIRCUIT

机译:集成电路,包括集成电路的显示面板以及集成电路的连接电阻测量方法

摘要

An integrated circuit (16) comprises: output terminal pair sections (BoutA, BoutB) configured by a pair of output terminal sections that output output signals to an output-side external wiring during normal operation; a pair of measurement signal terminal sections (Bt1, Bt2) connected to an input-side external wiring (13) and which input and output measurement signals during connection resistance measurement; a first measurement switch (SWIN) that switches the connection status between the pair of measurement signal terminal sections during connection resistance measurement; second measurement switches (SWA, SWB) that switch the connection status of the pair of measurement signal terminal sections (Bt1, Bt2) and the output terminal pair sections (BoutA, BoutB) during connection resistance measurement; and a switch control unit (20) that controls the switching operation of the first measurement switch (SWIN) and the second measurement switches (SWA, SWB).
机译:集成电路(16)包括:输出端子对部分(BoutA,BoutB),该输出端子对部分由在正常操作期间将输出信号输出到输出侧外部布线的一对输出端子部分构成;以及输出端子对部分(BoutA,BoutB)。一对测量信号端子部(Bt1,Bt2),其连接到输入侧外部配线(13),并且在连接电阻测量期间输入和输出测量信号;第一测量开关(SWIN),其在连接电阻测量期间切换一对测量信号端子部分之间的连接状态;第二测量开关(SWA,SWB)在连接电阻测量期间切换一对测量信号端子部分(Bt1,Bt2)和输出端子对部分(BoutA,BoutB)的连接状态;开关控制单元(20),其控制第一测量开关(SWIN)和第二测量开关(SWA,SWB)的开关操作。

著录项

  • 公开/公告号WO2012176700A1

    专利类型

  • 公开/公告日2012-12-27

    原文格式PDF

  • 申请/专利权人 SHARP KABUSHIKI KAISHA;

    申请/专利号WO2012JP65328

  • 发明设计人 玉木誠;

    申请日2012-06-15

  • 分类号G01R27/02;G02F1/13;G02F1/1345;

  • 国家 WO

  • 入库时间 2022-08-21 16:35:54

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