首页> 外国专利> SUBSTRATE PROCESSING METHOD AND A SUBSTRATE PROCESSING APPARATUS, CAPABLE OF REDUCING RUNNING COSTS AND UNIFORMLY ETCHING A SUBSTRATE

SUBSTRATE PROCESSING METHOD AND A SUBSTRATE PROCESSING APPARATUS, CAPABLE OF REDUCING RUNNING COSTS AND UNIFORMLY ETCHING A SUBSTRATE

机译:能够减少运行成本并均匀地吸引基质的基质处理方法和基质处理装置

摘要

PURPOSE: A substrate processing method and a substrate processing apparatus are provided to reduce the consumption of solvent vapor and etching vapor by raising the concentration of hydrogen fluoride to an etching concentration by using the etching vapor.;CONSTITUTION: A substrate is inputted to a processing unit (S1). IPA vapor or DIW vapor is supplied to the substrate (S2). HF vapor is supplied to the substrate (S3). The substrate is outputted from the processing unit (S4).;COPYRIGHT KIPO 2013;[Reference numerals] (AA) Start; (BB) Finish; (S1) Input a substrate; (S2) Form a liquid film (IPA vapor or DIW vapor); (S3) Etching (HF vapor); (S4) Output a substrate
机译:目的:提供一种基板处理方法和基板处理设备,以通过使用蚀刻蒸气将氟化氢的浓度提高到蚀刻浓度来减少溶剂蒸气和蚀刻蒸气的消耗。;组成:将基板输入到处理中单位(S1)。将IPA蒸气或DIW蒸气供应到基板(S2)。将HF蒸气供应到基板(S3)。从处理单元输出基板(S4)。COPYRIGHT KIPO 2013; [附图标记](AA)开始; (BB)完成; (S1)输入基板; (S2)形成液膜(IPA蒸气或DIW蒸气); (S3)蚀刻(HF蒸气); (S4)输出基板

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