首页> 外国专利> APPARATUS AND METHOD FOR EVALUATING INTERNAL VACUUM LEVEL OF VACUUM INSULATION PANEL USING FREQUENCY RESPONSE METHOD

APPARATUS AND METHOD FOR EVALUATING INTERNAL VACUUM LEVEL OF VACUUM INSULATION PANEL USING FREQUENCY RESPONSE METHOD

机译:利用频率响应法评估真空绝缘板内部真空度的装置和方法

摘要

PURPOSE: An apparatus and a method for evaluating internal vacuum level of vacuum insulation panel using frequency response member are provided to measure a natural frequency after adding impact to the surface of the vacuous insulators. CONSTITUTION: An apparatus for evaluating internal vacuum level of vacuum insulation panel using frequency response member comprises a hammer portion(110), a displacement measurement part(120), a frequency estimator(130) and a vacuum degree evaluation part(140). The hammer portion adds impact in order to exhaust a vacuous insulator(101). The displacement measurement part measures the displacement of the particle according to the impact added in the vacuous insulator. The frequency estimator measures the natural frequency of the vacuous insulator by using the displacement measurement value.
机译:目的:提供一种使用频率响应构件评估真空绝热板内部真空度的设备和方法,以在对真空绝热体的表面施加冲击后测量固有频率。构成:一种使用频率响应构件评估真空隔热板内部真空度的装置,包括锤部(110),位移测量部(120),频率估算器(130)和真空度评估部(140)。锤子部分增加了冲击力,以耗尽真空绝缘子(101)。位移测量部根据在真空绝缘体中施加的冲击来测量粒子的位移。频率估计器通过使用位移测量值来测量真空绝缘子的固有频率。

著录项

  • 公开/公告号KR101229622B1

    专利类型

  • 公开/公告日2013-02-04

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20100083853

  • 发明设计人 전승민;황승석;한정필;

    申请日2010-08-30

  • 分类号G01N19;G01M7/08;G01N29/04;

  • 国家 KR

  • 入库时间 2022-08-21 16:25:48

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